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草榴社区 29th Annual Test & SLM Special Interest Group (SIG)
Monday, October 9, 2023
6:30 p.m. - 10:00 p.m.
The Westin Anaheim Resort, Anaheim, CA
All members of the design and test community are invited to register to attend 草榴社区 29th Annual Test & SLM Special Interest Group (SIG) at the 2023 International Test Conference (ITC).
The event will host experts from leading companies including Kioxia, SARC, MediaTek and others who will describe how 草榴社区 Test and SLM solutions including Test-AI, distributed ATPG, high-speed test fabric, and automotive test are enabling them to achieve their quality and TTM goals.
Attendees will also have the opportunity to meet with 草榴社区 experts to discuss and learn more about Test and SLM technologies. Appetizers and cocktails will be served, followed by a sit-down dinner and prize drawings!
Pioneering Firsts at ITC 2023
2023 was a milestone year for 草榴社区 with pioneering revolutionary new technology in test and AI with the introductions of 草榴社区 TSO.ai and Silicon.da. Watch this video to see how our customers are solving their toughest test challenges with 草榴社区 solutions.
Agenda
6:30 p.m. - 7:15 p.m.
7:15 p.m. - 7:20 p.m.
7:20 p.m. - 7:30 p.m.
7:30 p.m. - 9:00 p.m.
9:00 p.m. - 10:00 p.m.
Cocktail Reception
Welcome
Yervant Zorian, 草榴社区 Fellow at 草榴社区
Opening Remarks and Presentation
Dr. Debendra Das Sharma, Intel Senior Fellow at Intel Corporation, Chair Universal Chiplet Interconnect Express (UCIe) Consortium
Presentations:
Achieving Dramatic Reduction in Turn-around Time and Test Cost with Highly Distributed ATPG and TSO.ai
Shohei Morishima, Specialist at Kioxia
Methodology for Manufacturing and In-system Test on Mobile and Automotive GPUs with Streaming Fabric, SEQ/XLBIST and IEEE1687
Rajkumar Pampana, Principal Engineer at Samsung SARC
Implementation of Streaming Fabric and Sequential Compression Technology on Smartphone SOC with High-speed USB Interface
Prashant Balakrishnan, Director at MediaTek
And more!
Raffle Drawing and Dessert
草榴社区 at International Test Conference (ITC)
Sunday, October 8 - Friday, October 13, 2023
Disneyland Hotel, Anaheim, CA
Exhibit Hours
Tuesday, October 10
10:30 a.m. - 5:30 p.m.
Wednesday, October 11
9:30 a.m. - 4:30 p.m.
Thursday, October 12
9:30 a.m. - 1:00 p.m.
Platinum Sponsor Session
Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 3
Session C2: Presentations of Platinum Supporters
Pioneering AI 草榴社区 for Test & Silicon Lifecycle Management (SLM)
草榴社区 Presenter: Matt Knowles
Visit the 草榴社区 Booth
The 草榴社区 TestMAX? family offers innovative test and diagnosis for all silicon designs and enables a unified flow within the 草榴社区’ Digital Design Family. 草榴社区 TestMAX works in conjunction with the latest 草榴社区 Silicon Lifecyle Management (SLM) technology for enhanced in-chip observability, silicon health and analytics, meeting both design and test goals concurrently.
This year we will be highlighting industry first Test and SLM technologies that encompass integrated tools, IP and methodologies which enable optimized quality, performance and reliability at each phase of the device lifecycle from in-design, in-ramp, in-production and in-field.
See demonstrations on:
- High Speed Test Over HSIO
- TSO.ai Test Optimization
- Silicon.da Real-Time Analytics
- Advanced Logic/Memory Test
Let's Meet
Whether you want a quick chat to catch up or want to go deep on details, please reach out to us to schedule an on-site meeting.
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Poster Sessions
Wednesday, October 11 | 12:00 - 2:00 p.m. | Exhibit Floor
Advantest Author: Sri Ganta; 草榴社区 Authors: Ash Patel, Ramsay Allen
Test Robustness and Glitch Detection with TestMAX Advisor
Ericsson Authors: Anurag Jindal, Dhinakaran Varadhan; 草榴社区 Authors: Raja Koneru, Ramsay Allen
Effective Yield Boost and Cost Saving by Volume Diagnosis using Yield Explorer
MediaTek Authors: Anti P.H. Tseng, Joe Y.J. Chiu, Emma Chou and Kun-Yang Hsu; 草榴社区 Authors: Thomas C.Y. Liu, Teng-Wei Shao, James Z.J. Lin,
Test Scalability with Sequential Compression Technology
MediaTek Authors: Mark Nathan, Lichao Chen, Tommy Ngo, Minh Chau; 草榴社区 Authors: Lakshmi Kalingavaram Ramachandra, Bala Tarun Nelapatla
Cell-Aware Failure Analysis: Advanced Cell-Aware Techniques to Identify the FEOL/MOL Layer Systematic Defects in Cutting-Edge Technology
Samsung Foundry Authors: Jaeseok Park, Hyunyeol Lim, Yongseok Son, Dongkwan Han; 草榴社区 Authors: Jeongsu Park, Yewon Lee, Camelia Hora, Ruifeng Guo
The Importance of Sensor Analytics in Enabling Silicon Lifecycle Management
草榴社区 Authors: Mark Laird, Ramsay Allen
Deep Silicon Data and Analytics for Lifelong Safety and Reliability
草榴社区 Authors: Dan Alexandrescu, Lorin Kennedy, Ramsay Allen, Jamileh Davoudi, Pawini Mahajan
Holistic Approach to Solving Silent Data Corruption
草榴社区 Author: Adam Cron
Advanced Test Point and Wrapping Techniques for Automotive Designs
NXP Authors: Geoff Shofner, Chris Falk; 草榴社区 Authors: Raja Koneru, Ramsay Allen
Physical Connection Aware SMS BIST Implementation for Abutted Design
草榴社区 Authors: Doo Kim, Mohammed Mosin Junjawadkar, Dooyoung Kim, Manish Arora
New TestMAX XLBIST Parallel Interface
ST Author: Marco Casarsa; 草榴社区 Author: Alfredo Conte
Advantest Author: Ken Butler; 草榴社区 Author: Guy Cortez
Technical Sessions
Tuesday, October 10 | 2:00 – 2:30 p.m. | Magic Kingdom Ball 1
Session A1: Industrial Practices (Long Papers)
A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation
TSMC Presenter: Anshuman Chandra; TSMC Authors: Anshuman Chandra, Moiz Khan, Sandeep Kumar Goel, Ankita Patidar, Fumiaki Takashima; 草榴社区 Authors: Manish Arora, Bharath Shankaranarayanan, Vistrita Tyagi, Vuong Nguyen
Tuesday, October 10 | 1:30 – 3:00 p.m. | Magic Kingdom Ball 4
Session D1: Modern Memory Trends (Special Session)
草榴社区 Commentary: Gurgen Harutyunyan
Talk 1: “Test Challenges for GAA in the Race Between Nanometers and Angstroms”
草榴社区 Authors: Karen Amirkhanyan, Hayk Danoyan, Artur Ghukasyan, Gurgen Harutyunyan, Knarik Kyuregyan, Grigor Tshagharyan
Talk 3: “Utilizing Clever ECC Analytics to Improve Memory Lifecycle Management”
AMD Author: Costas Argyrides; 草榴社区 Authors: Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 3
Session C2: Presentations of Platinum Supporters
Pioneering AI 草榴社区 for Test & Silicon Lifecycle Management (SLM)
草榴社区 Presenter: Matt Knowles
Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 4
Session D2: HIR & UCIe (Special Session)
草榴社区 Commentary: Yervant Zorian
Thursday, October 12 | 10:30 – 12:00 p.m. | Magic Kingdom Ball 4
Session D5: SLM – In-Field Testing
草榴社区 Commentary: Yervant Zorian
ARTS Workshop
Thursday, October 12 | 5:00 - 6:30 p.m.
Technical Session 1 – Automotive Chip Reliability and Resilience
Path Margin Monitor for Silicon Lifecycle
草榴社区 Authors: Kranthi Kandula, Ramalingam Kolisetti
Friday, October 13 | 10:30 - 12:00 p.m.
Technical Session 3 – Analog Testing 草榴社区 for Automotive Chips
Analog/Mixed-signal Fault Analysis using Custom Fault Approach
草榴社区 Authors: Leela Krishna Thota, Varun Reddy, Sreenivasa Rao Vuttaravilli
SLM Workshop
Thursday, October 12 | 5:15 – 6:30 p.m.
Panel Discussion - Silent Data Corruption: Requirements and
Mitigation | Moderator: Mehdi Tahoori (KIT)
Harish Dixit (Meta), Sankaranarayanan Gurumurthy (AMD), Yervant Zorian (草榴社区), Dimitris Gizopoulos (University of Athens), Adit Singh (Auburn U)
Friday, October 13, 2023 | 8: 30 -10:00 a.m.
Technical Session - Utilizing ECC Analytics to Improve
Memory Lifecycle Management
Costas Argyrides (AMD, USA), Grigor Tshagharyan (草榴社区, Armenia), Gurgen Harutyunyan (草榴社区, Armenia), Yervant Zorian (草榴社区, USA)
Friday, October 13| 10:30am – 12:00 p.m.
Panel Discussion - Ushering in the Dependability Era with IEEE P2851 | Moderator: Fred Gruner (Nvidia)
Jyotika Athavale (草榴社区), Chen, Wei-Ren (New Taipei City),Viswanathan Pillai (TI), Nir Maor (Qualcomm) Meirav Nitzan (Qualcomm)
For more information about 草榴社区’ comprehensive test solution, please visit: synopsys.com/test
