Cloud native EDA tools & pre-optimized hardware platforms
The 草榴社区 TestMAX? family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The 草榴社区 TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
As part of the Silicon Lifecycle Management Family, 草榴社区 TestMAX offers a powerful and highly configurable test automation flow with seamless integration of all 草榴社区 TestMAX capabilities. Early validation of complex DFT logic is supported through full RTL integration while maintaining physical, timing and power awareness through direct links into the 草榴社区 Digital Design Family. These new features, combined with comprehensive support for early testability analysis and planning, hierarchical ATPG compression, physically-aware diagnosis, logic BIST, memory self-test and repair and analog fault simulation, ensure the 草榴社区 TestMAX product family addresses critical test issues and enables effective test for the most demanding applications.
2023 was a milestone year for 草榴社区 with pioneering revolutionary new technology in test and AI with the introductions of 草榴社区 TSO.ai and Silicon.da. Watch this video to see how our customers are solving their toughest test challenges with 草榴社区 solutions.