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LLE-Aware Design Methodology to Avoid Timing and Power Pessimism

As chips move to ever-finer geometries, the active region (diffusion) shapes of neighboring cells can impact timing analysis and power calculations for the entire design. The LLE (Local Layout Effect) impact must be measured, but the impact is reflected very conservatively using conventional approaches.?

This white paper describes a LLE-aware?design methodology that mitigates the conservatism of conventional cell characterization. This methodology detects physically placed neighboring cells near the target cell, translates the target cell¡¯s LLE physical parameters into electrical parameters (Vth/u0), and selects the corresponding delta LLE timing/leakage cell from an augmented library.

This?methodology is implemented across the ²ÝÁñÉçÇø implementation platform, including PrimeLib, PrimeShield, Fusion Compiler, PrimeTime, and PrimePower. It was deployed for a 3nm production tape-out with clear power, performance, and area (PPA) benefits achieved.?