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User Papers and Presentations |
TA1 Low Power Optimization and Checking |
(2nd Place - Best Presentation) Author(s): Parag Mandrekar, Joseph Gutierrez, Hank Lin - Advanced Micro Devices; Vishwanath Sundararaman - 草榴社区 |
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TA3 Testbench Best Practices |
Author(s): Clifford E. Cummings - Sunburst Design |
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(Technical Committee Award) Author(s): John Dickol - Samsung |
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Author(s): Jeff Montesano, Jeff Vance - Verilab |
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TA4 Simulation, Advanced Usage, and Debug |
Author(s): Jie Wen, Amol Bhinge, Vaibhav Kumar - NXP Semiconductors; Jiri Prevratil - 草榴社区 |
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Author(s): Will Adams - Advanced Micro Devices |
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Author(s): Vibarajan Viswanathan, Doug Reed - Centaur Technology; Juliet Runhaar, Jun Zhao - 草榴社区 |
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TA5 Prototyping |
Author(s): Barry Spotts, Robert Kaye - ARM |
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Author(s): Mark Nadon - 草榴社区 |
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TB3 Testbench Quality and Formal Verification |
(3rd Place - Best Presentation) Author(s): Varun Ramesh, Amol Bhinge - NXP Semiconductors; Jay Dutt - 草榴社区 |
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TB4 Functional Coverage and Testbench Considerations |
Author(s): Jeremy Ridgeway, Kavitha Chaturvedula - Broadcom |
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TB5 Characterization |
Author(s): Amlan Ghosh, Keith Kasprak - Advanced Micro Devices; Dave Hedges - 草榴社区 |
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Author(s): Savithri Sundareswaran - NXP Semiconductors |
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TB6 DFTMAX Ultra Applications |
(1st Place - Best Presentation) Author(s): Christopher Ryan, Kien Vi - Maxim Integrated |
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Author(s): Vivek Ramnath, Kelvin Ge, Padma Rayapureddy - Samsung; Surya Duggirala - 草榴社区 |
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TC3 Formal Verification |
Author(s): Xiushan Feng - Oracle; Abhishek Muchandikar, Xiaolin Chen - 草榴社区 |
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Author(s): Sankar Gurumurthy, Farhan Rahman - Advanced Micro Devices; Ankit Saxena, Ashutosh Prasad - Oski Technology |
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Author(s): Vinayak Kamath - Advanced Micro Devices; Xiaolin Chen - 草榴社区 |
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TC4 Testbench Quality and Reuse |
Author(s): Aditya Musunuri, Amol Bhinge - NXP Semiconductors; Nasib Naser - 草榴社区 |
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Author(s): Gaurav Brahmbhatt, Pinal Patel, Gaurang Chitroda, Manish Patel - eInfochips; Joe McCann - 草榴社区 |
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Author(s): Nick Jones - Samsung |