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Requirements and Best Practices for Trustworthy Automotive Semiconductors

The complexity of electronic systems supporting Advanced Driver Assistance Systems (ADAS), Highly Automated Driving (HAD), and in-vehicle infotainment is growing exponentially. This, together with the move from multiple domain-specific Electronic Control Units (ECUs) to a zonal architecture will require high-performance computing. Furthermore, new use cases for Battery Electric Vehicles (BEV) introduce design challenges to support more on-time than ever before. As a part of the VE-VIDES project, funded by the German Federal Ministry of Education and Research (BMBF), ²ÝÁñÉçÇø and CARIAD have collaborated to outline a wide range of requirements for overcoming the challenges for today¡¯s automotive semiconductor design and enable the four main aspects of semiconductor trustworthiness and dependability: quality, functional safety (FuSa), reliability, and security. This white paper highlights the outcome of the close collaboration between ²ÝÁñÉçÇø and CARIAD/Audi and explains the challenges and best practices for helping designers achieve optimal semiconductor quality, FuSa, reliability, and security.